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Bienvenue sur la collection HAL du LARIS
Direction | Sébastien LAHAYE
Référent·e HAL | Marie-Françoise GÉRARD
Fichiers
469
Références
823
Proportion d'Open Access
45 %
Actualités du Laboratoire
Arthur IGNAZI nous présentera ses travaux de thèse intitulés "Les box atlas : une décomposition des manifolds pour l'analyse par intervalles" le 16 mai 2024 à 11h00.
Mots-Clés
Aging
Performance
Image analysis
Monitoring
Inverse problems
Thermal comfort
Data mining
Partial differential equations
Empirical mode decomposition
Fiabilité
Conducted immunity
Nonlinear dynamics
Epilepsy
Convolutional neural network
Feature extraction
Degradation
Max-plus algebra
Bayesian networks
Laser speckle contrast imaging
MATLAB
Prediction
Microcirculation
Estimation
Awake surgery
Control
Virtual reality
COVID-19
Older adults
Irregularity
Data augmentation
Complexité
Machine Learning
Image processing
Stochastic resonance
Conjugate gradient method
MRI
Heat transfer
Diagnostic
Machine learning
Numerical simulation
Multiscale entropy
Discrete event systems
Accelerated degradation test
Quantum information
Inverse problem
Complexity
Fault diagnosis
Detection
Durability
State estimation
Cognition
Petri nets
Degradation process
Scheduling
Reliability
Computer vision
Segmentation
Bayesian inference
Identification
Gamma process
Sample entropy
Cerebral palsy
Modeling
Optimization
Entropy
Deep learning
Brain
Classification
Electroencephalography
Imaging
Cycle time
Concrete
Fault detection
Timed event graphs
Simulation
Interaction Techniques
Complex systems
Lean manufacturing
Optimisation
Decoherence
Interval analysis
Heat recovery
Control chart
Réalité virtuelle
Bayesian network
Quantum noise
Accelerated testing
Correlation
Accelerated tests
Algorithm
Graph matching
Stroke
Max
Texture
Thermal modeling
Social cognition
Quadratic assignment problem
Parameter estimation
Six Sigma
Diagnosis
Publications des équipes de recherche du LARIS
SDO | Systèmes Dynamiques et Optimisation ISISV | Information, Signal, Image et Sciences du Vivant SFD | Sûreté de Fonctionnement et aide à la DécisionDernières parutions
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Jaber Al Rashid, Mohsen Koohestani, Laurent Saintis, Mihaela Barreau. Degradation and Reliability Modeling of EM Robustness of Voltage Regulators Based on ADT: An Approach and A Case Study. IEEE Transactions on Device and Materials Reliability, 2024, 24 (1), pp.2-13. ⟨10.1109/TDMR.2023.3340426⟩. ⟨hal-04334074⟩